"Path dependent stochastic models to detect planned and actual technology ..."

Bruno Rossi, Barbara Russo, Giancarlo Succi (2011)

Details and statistics

DOI: 10.1016/J.INFSOF.2011.05.002

access: closed

type: Journal Article

metadata version: 2022-06-23

a service of  Schloss Dagstuhl - Leibniz Center for Informatics