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"Automated isolation for white-box test generation."

David Honfi, Zoltán Micskei (2020)

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DOI: 10.1016/J.INFSOF.2020.106319

access: open

type: Journal Article

metadata version: 2022-08-16

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  - https://dblp.org/rec/journals/infsof/HonfiM20
David Honfi, Zoltán Micskei:
Automated isolation for white-box test generation. Inf. Softw. Technol. 125: 106319 (2020)

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