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"Insulator Defect Detection Based on YOLOv8s-SwinT."

Zhendong He et al. (2024)

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DOI: 10.3390/INFO15040206

access: open

type: Journal Article

metadata version: 2024-04-29

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  dblp key:
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  - https://dblp.org/rec/journals/information/HeYLZLLZ24
Zhendong He, Wenbin Yang, Yanjie Liu, Anping Zheng, Jie Liu, Taishan Lou, Jie Zhang:
Insulator Defect Detection Based on YOLOv8s-SwinT. Inf. 15(4): 206 (2024)

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