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"Forensic metrology: a new application field for measurement experts across ..."

Alessandro Ferrero, Veronica Scotti (2013)

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DOI: 10.1109/MIM.2013.6417051

access: closed

type: Journal Article

metadata version: 2017-06-06

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Alessandro Ferrero, Veronica Scotti:
Forensic metrology: a new application field for measurement experts across techniques and ethics. IEEE Instrum. Meas. Mag. 16(1): 14-17 (2013)

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