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"Test Scenario Generation Based on Formal Specification and Usage Profile."

Kai H. Chang et al. (2000)

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DOI: 10.1142/S0218194000000110

access: closed

type: Journal Article

metadata version: 2024-04-18

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Kai H. Chang, Shih-Sung Liao, Richard Chapman, Chun-Yu Chen:
Test Scenario Generation Based on Formal Specification and Usage Profile. Int. J. Softw. Eng. Knowl. Eng. 10(2): 185-201 (2000)

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