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"True sparse PCA for reducing the number of essential sensors in virtual ..."

Yifan Xie et al. (2024)

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DOI: 10.1080/00207543.2023.2217282

access: closed

type: Journal Article

metadata version: 2024-03-25

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Yifan Xie, Tianhui Wang, Young-Seon Jeong, Ali Tosyali, Myong K. Jeong:
True sparse PCA for reducing the number of essential sensors in virtual metrology. Int. J. Prod. Res. 62(6): 2142-2157 (2024)

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