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"A new lot sentencing approach by variables inspection based on process yield."

Chien-Wei Wu, Shih-Wen Liu (2018)

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DOI: 10.1080/00207543.2018.1424365

access: closed

type: Journal Article

metadata version: 2021-10-14

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Chien-Wei Wu, Shih-Wen Liu:
A new lot sentencing approach by variables inspection based on process yield. Int. J. Prod. Res. 56(12): 4087-4099 (2018)

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