"A generalised uncertain decision tree for defect classification of ..."

Byunghoon Kim et al. (2020)

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DOI: 10.1080/00207543.2019.1637035

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type: Journal Article

metadata version: 2024-03-25

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Byunghoon Kim, Young-Seon Jeong, Seung Hoon Tong, Myong K. Jeong:
A generalised uncertain decision tree for defect classification of multiple wafer maps. Int. J. Prod. Res. 58(9): 2805-2821 (2020)

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