"A probabilistic approach for testing large-scale integrated circuits."

Shanker Singh, Vijendra Pal Singh (1978)

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DOI: 10.1007/BF00991634

access: closed

type: Journal Article

metadata version: 2020-04-01

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Shanker Singh, Vijendra Pal Singh:
A probabilistic approach for testing large-scale integrated circuits. Int. J. Parallel Program. 7(3): 283-294 (1978)

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