"Tolerating Radiation-Induced Transient Faults in Modern Processors."

Xiaobin Li, Jean-Luc Gaudiot (2010)

Details and statistics

DOI: 10.1007/S10766-009-0114-9

access: closed

type: Journal Article

metadata version: 2020-04-01

a service of  Schloss Dagstuhl - Leibniz Center for Informatics