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"Thread-Parallel Integrated Test Pattern Generator Utilizing Satisfiability ..."

Alejandro Czutro et al. (2010)

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DOI: 10.1007/S10766-009-0124-7

access: closed

type: Journal Article

metadata version: 2023-03-21

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Alejandro Czutro, Ilia Polian, Matthew Lewis, Piet Engelke, Sudhakar M. Reddy, Bernd Becker:
Thread-Parallel Integrated Test Pattern Generator Utilizing Satisfiability Analysis. Int. J. Parallel Program. 38(3-4): 185-202 (2010)

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