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"Variation of I-V characteristics due to process parameters as base for ..."

Roberto Marani, Anna Gina Perri (2018)

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DOI: 10.1142/S1793962318500150

access: closed

type: Journal Article

metadata version: 2020-05-27

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Roberto Marani, Anna Gina Perri:
Variation of I-V characteristics due to process parameters as base for modeling the component variability for LDD MOSFET devices. Int. J. Model. Simul. Sci. Comput. 9(2): 1850015:1-1850015:12 (2018)

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