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"Variation of I-V characteristics due to process parameters as base for ..."
Roberto Marani, Anna Gina Perri (2018)
- Roberto Marani
, Anna Gina Perri:
Variation of I-V characteristics due to process parameters as base for modeling the component variability for LDD MOSFET devices. Int. J. Model. Simul. Sci. Comput. 9(2): 1850015:1-1850015:12 (2018)
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