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"Wavelet Analysis to Real-Time Fabric Defects Detection in Weaving processes."

Sungshin Kim et al. (2002)

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DOI: 10.5391/IJFIS.2002.2.1.089

access: closed

type: Journal Article

metadata version: 2020-07-03

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  - https://dblp.org/rec/journals/ijflis/KimBJV02
Sungshin Kim, Hyeon Bae, Jae-Ryong Jung, George J. Vachtsevanos:
Wavelet Analysis to Real-Time Fabric Defects Detection in Weaving processes. Int. J. Fuzzy Log. Intell. Syst. 2(1): 89-93 (2002)

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