"A periodic review inventory model subject to shrinkage type errors: impact ..."

Yacine Rekik, Zied Jemaï (2009)

> Home

Details and statistics

DOI: 10.1504/IJEB.2009.023610

access: closed

type: Journal Article

metadata version: 2020-07-16

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/ijeb/RekikJ09
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ijeb/RekikJ09
Yacine Rekik, Zied Jemaï:
A periodic review inventory model subject to shrinkage type errors: impact of RFID. Int. J. Electron. Bus. 7(1): 68-85 (2009)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.