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"Module defect prediction under the Eclipse platform: the quadratic effect ..."

James Jungbae Roh, Jim Stoeckel, Jooh Lee (2015)

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DOI: 10.1504/IJDATS.2015.067703

access: closed

type: Journal Article

metadata version: 2020-05-11

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James Jungbae Roh, Jim Stoeckel, Jooh Lee:
Module defect prediction under the Eclipse platform: the quadratic effect of software size and the influence of prerelease defects. Int. J. Data Anal. Tech. Strateg. 7(1): 96-109 (2015)

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