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"Improvement of the contraction‐type LP test algorithm for finding ..."

Kiyotaka Yamamura, Shigeru Tanaka (2001)

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DOI: 10.1002/CTA.159

access: closed

type: Journal Article

metadata version: 2020-05-11

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Kiyotaka Yamamura, Shigeru Tanaka:
Improvement of the contraction‐type LP test algorithm for finding all solutions of piecewise‐linear resistive circuits. Int. J. Circuit Theory Appl. 29(4): 403-411 (2001)

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