"Characteristic parameter model and circuit-level simulation of ..."

Yujie Liu et al. (2024)

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DOI: 10.1002/CTA.4013

access: closed

type: Journal Article

metadata version: 2025-03-25

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Yujie Liu, Yang Wang, Jian Yang, Xiangliang Jin:
Characteristic parameter model and circuit-level simulation of gate-controlled dual direction SCR for on-chip ESD protection. Int. J. Circuit Theory Appl. 52(10): 5042-5056 (2024)

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