"A uniform approach to mixed-signal circuit test."

Feng Lin, Zheng-Hui Lin, T. William Lin (1997)

> Home

Details and statistics

DOI: 10.1002/%28SICI%291097-007X%28199703/04%2925:2%3C81::AID-CTA952%3E3.0.CO;2-P

access: closed

type: Journal Article

metadata version: 2020-05-11

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/ijcta/LinLL97
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/ijcta/LinLL97
Feng Lin, Zheng-Hui Lin, T. William Lin:
A uniform approach to mixed-signal circuit test. Int. J. Circuit Theory Appl. 25(2): 81-93 (1997)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.