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"Analyzing noise robustness of wide fan-in dynamic logic gates under ..."

Fabio Frustaci et al. (2014)

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DOI: 10.1002/CTA.1862

access: closed

type: Journal Article

metadata version: 2020-05-11

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Fabio Frustaci, Marco Lanuzza, Stefania Perri, Pasquale Corsonello:
Analyzing noise robustness of wide fan-in dynamic logic gates under process variations. Int. J. Circuit Theory Appl. 42(5): 452-467 (2014)

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