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"A new analytical/iterative approach to statistical delay characterization ..."

Syed A. Aftab, M. A. Styblinski (1995)

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DOI: 10.1002/CTA.4490230104

access: closed

type: Journal Article

metadata version: 2020-05-11

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  - journals/ijcta/AftabS95
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  - https://dblp.org/rec/journals/ijcta/AftabS95
Syed A. Aftab, M. A. Styblinski:
A new analytical/iterative approach to statistical delay characterization of cmos digital combinational circuits. Int. J. Circuit Theory Appl. 23(1): 23-47 (1995)

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