"Critical Points of Distance to an epsilon-Sampling of a Surface and ..."

Tamal K. Dey et al. (2008)

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DOI: 10.1142/S0218195908002532

access: closed

type: Journal Article

metadata version: 2020-06-04

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Tamal K. Dey, Joachim Giesen, Edgar A. Ramos, Bardia Sadri:
Critical Points of Distance to an epsilon-Sampling of a Surface and Flow-Complex-Based Surface Reconstruction. Int. J. Comput. Geom. Appl. 18(1/2): 29-61 (2008)

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