"A Novel Lumped Two Degrees Of Freedom Pull-In Approach To Electrostatic ..."

J.-M. Huang et al. (2003)

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DOI: 10.1142/S1465876303001770

access: closed

type: Journal Article

metadata version: 2020-07-09

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J.-M. Huang, A. Q. Liu, X. M. Zhang, J. Ahn:
A Novel Lumped Two Degrees Of Freedom Pull-In Approach To Electrostatic Torsional Micromirrors. Int. J. Comput. Eng. Sci. 4(3): 569-572 (2003)

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