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"Thin Film Thickness Measurement by Surface Plasmon Resonance Using a ..."
Yasuhiro Mizutani, Tetsuo Iwata (2011)
- Yasuhiro Mizutani, Tetsuo Iwata:
Thin Film Thickness Measurement by Surface Plasmon Resonance Using a Modified Otto's Configuration Combined with Ellipsometry. Int. J. Autom. Technol. 5(2): 236-240 (2011)
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