default search action
"Thin Film Thickness Measurement by Surface Plasmon Resonance Using a ..."
Yasuhiro Mizutani, Tetsuo Iwata (2011)
- Yasuhiro Mizutani, Tetsuo Iwata:
Thin Film Thickness Measurement by Surface Plasmon Resonance Using a Modified Otto's Configuration Combined with Ellipsometry. Int. J. Autom. Technol. 5(2): 236-240 (2011)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.