"Defect detection of printed circuit board based on lightweight deep ..."

Jiaquan Shen, Ningzhong Liu, Han Sun (2020)

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DOI: 10.1049/IET-IPR.2020.0841

access: closed

type: Journal Article

metadata version: 2022-10-02

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Jiaquan Shen, Ningzhong Liu, Han Sun:
Defect detection of printed circuit board based on lightweight deep convolution network. IET Image Process. 14(15): 3932-3940 (2020)

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