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"Guest Editorial: Defect and Fault Tolerance in VLSI and Nanotechnology ..."

Antonio Miele, Martin A. Trefzer, S. Saqib Khursheed (2019)

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DOI: 10.1049/IET-CDT.2019.0097

access: closed

type: Journal Article

metadata version: 2020-07-14

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Antonio Miele, Martin A. Trefzer, S. Saqib Khursheed:
Guest Editorial: Defect and Fault Tolerance in VLSI and Nanotechnology Systems. IET Comput. Digit. Tech. 13(3): 127-128 (2019)

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