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"Optimising pseudo-random built-in self-testing of fully synchronous as ..."

Alessandro Strano et al. (2013)

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DOI: 10.1049/IET-CDT.2012.0064

access: closed

type: Journal Article

metadata version: 2021-12-17

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Alessandro Strano, Nicola Caselli, Simone Terenzi, Davide Bertozzi:
Optimising pseudo-random built-in self-testing of fully synchronous as well as multisynchronous networks-on-chip. IET Comput. Digit. Tech. 7(2) (2013)

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