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"Effectiveness of scan-based delay fault tests in diagnosis of transition ..."

Irith Pomeranz, Sudhakar M. Reddy (2007)

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DOI: 10.1049/IET-CDT:20070029

access: closed

type: Journal Article

metadata version: 2020-07-14

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Irith Pomeranz, Sudhakar M. Reddy:
Effectiveness of scan-based delay fault tests in diagnosis of transition faults. IET Comput. Digit. Tech. 1(5): 537-545 (2007)

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