"Droop sensitivity of stuck-at fault tests."

Debasis Mitra, Susmita Sur-Kolay, Bhargab B. Bhattacharya (2009)

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DOI: 10.1049/IET-CDT:20080020

access: closed

type: Journal Article

metadata version: 2020-07-14

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Debasis Mitra, Susmita Sur-Kolay, Bhargab B. Bhattacharya:
Droop sensitivity of stuck-at fault tests. IET Comput. Digit. Tech. 3(2): 175-193 (2009)

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