"Improving high-level and gate-level testing with FATE: A functional ..."

Giuseppe Di Guglielmo et al. (2007)

> Home

Details and statistics

DOI: 10.1049/IET-CDT:20060139

access: closed

type: Journal Article

metadata version: 2020-07-14

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/iet-cdt/GuglielmoFMP07
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/iet-cdt/GuglielmoFMP07
Giuseppe Di Guglielmo, Franco Fummi, Cristina Marconcini, Graziano Pravadelli:
Improving high-level and gate-level testing with FATE: A functional automatic test pattern generator traversing unstabilised extended FSM. IET Comput. Digit. Tech. 1(3): 187-196 (2007)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.