"Error control combining Hamming and product codes for energy efficient ..."

Bo Fu, Paul Ampadu (2010)

> Home

Details and statistics

DOI: 10.1049/IET-CDT.2008.0130

access: closed

type: Journal Article

metadata version: 2025-05-01

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/iet-cdt/FuA10
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/iet-cdt/FuA10
Bo Fu, Paul Ampadu:
Error control combining Hamming and product codes for energy efficient nanoscale on-chip interconnects. IET Comput. Digit. Tech. 4(3): 251-261 (2010)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.