"Extending gate-level diagnosis tools to CMOS intra-gate faults."

Xinyue Fan et al. (2007)

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DOI: 10.1049/IET-CDT:20060206

access: closed

type: Journal Article

metadata version: 2020-07-14

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Xinyue Fan, Will R. Moore, Camelia Hora, Guido Gronthoud:
Extending gate-level diagnosis tools to CMOS intra-gate faults. IET Comput. Digit. Tech. 1(6): 685-693 (2007)

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