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"Charge-based testing BIST for embedded memories."
Bartomeu Alorda, Ivan de Paúl, Jaume Segura (2007)
- Bartomeu Alorda
, Ivan de Paúl, Jaume Segura
:
Charge-based testing BIST for embedded memories. IET Comput. Digit. Tech. 1(5): 481-490 (2007)
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