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"Built-in self-test structure for fault detection of charge-pump ..."

Lanhua Xia et al. (2016)

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DOI: 10.1049/IET-CDS.2015.0224

access: closed

type: Journal Article

metadata version: 2024-02-26

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Lanhua Xia, Jianhui Wu, Cheng Huang, Meng Zhang:
Built-in self-test structure for fault detection of charge-pump phase-locked loop. IET Circuits Devices Syst. 10(4): 317-321 (2016)

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