Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Wear-out stress monitor utilising temperature and voltage sensitive ring ..."

Kan Takeuchi et al. (2018)

> Home

Details and statistics

DOI: 10.1049/IET-CDS.2017.0153

access: closed

type: Journal Article

metadata version: 2020-09-10

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/iet-cds/TakeuchiSOSNT18
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/iet-cds/TakeuchiSOSNT18
Kan Takeuchi, Masaki Shimada, Takeshi Okagaki, Koji Shibutani, Koji Nii, Fumio Tsuchiya:
Wear-out stress monitor utilising temperature and voltage sensitive ring oscillators. IET Circuits Devices Syst. 12(2): 182-188 (2018)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.