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"Interface trap charges associated reliability analysis of Si/Ge ..."

Suruchi Sharma, Rikmantra Basu, Baljit Kaur (2021)

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DOI: 10.1049/CDS2.12037

access: open

type: Journal Article

metadata version: 2022-10-24

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  - https://dblp.org/rec/journals/iet-cds/SharmaBK21
Suruchi Sharma, Rikmantra Basu, Baljit Kaur:
Interface trap charges associated reliability analysis of Si/Ge heterojunction dopingless TFET. IET Circuits Devices Syst. 15(5): 424-433 (2021)

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