"Comparative study of electro-thermal characteristics of 4500 V ..."

Rui Jin et al. (2021)

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DOI: 10.1049/CDS2.12022

access: open

type: Journal Article

metadata version: 2022-10-24

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Rui Jin, Yaohua Wang, Li Li, Longlai Xu, Kui Pu, Jun Zeng, Mohamed Darwish:
Comparative study of electro-thermal characteristics of 4500 V diffusion-CS IGBT and buried-CS IGBT. IET Circuits Devices Syst. 15(3): 251-259 (2021)

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