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"Parameter extraction method for universal amorphous silicon thin-film ..."

Jong Woo Jin et al. (2012)

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DOI: 10.1049/IET-CDS.2011.0124

access: closed

type: Journal Article

metadata version: 2021-10-14

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  - https://dblp.org/rec/journals/iet-cds/JinODMB12
Jong Woo Jin, Maher Oudwan, Dmitri Daineka, Oumkelthoum Moustapha, Yvan Bonnassieux:
Parameter extraction method for universal amorphous silicon thin-film transistors simulation program with integrated circuit emphasis model. IET Circuits Devices Syst. 6(2): 118-121 (2012)

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