"Adjacency criticality: a simple yet effective metric for statistical ..."

Seyed Milad Ebrahimipour, Behnam Ghavami, Mohsen Raji (2019)

> Home

Details and statistics

DOI: 10.1049/IET-CDS.2018.5616

access: closed

type: Journal Article

metadata version: 2025-01-19

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/iet-cds/EbrahimipourGR19
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/iet-cds/EbrahimipourGR19
Seyed Milad Ebrahimipour, Behnam Ghavami, Mohsen Raji:
Adjacency criticality: a simple yet effective metric for statistical timing yield optimisation of digital integrated circuits. IET Circuits Devices Syst. 13(7): 979-987 (2019)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.