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"High Accuracy Test Techniques with Fine Pattern Generator and Ramp Test ..."

Fukashi Morishita et al. (2022)

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DOI: 10.1587/TRANSELE.2021CDP0001

access: closed

type: Journal Article

metadata version: 2023-06-26

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Fukashi Morishita, Wataru Saito, Norihito Kato, Yoichi Iizuka, Masao Ito:
High Accuracy Test Techniques with Fine Pattern Generator and Ramp Test Circuit for CMOS Image Sensor. IEICE Trans. Electron. 105-C(7): 316-323 (2022)

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