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"Simulation-Based Understanding of "Charge-Sharing Phenomenon" Induced by ..."

Akifumi Maru et al. (2022)

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DOI: 10.1587/TRANSELE.2021ECS6008

access: closed

type: Journal Article

metadata version: 2022-05-12

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Akifumi Maru, Akifumi Matsuda, Satoshi Kuboyama, Mamoru Yoshimoto:
Simulation-Based Understanding of "Charge-Sharing Phenomenon" Induced by Heavy-Ion Incident on a 65nm Bulk CMOS Memory Circuit. IEICE Trans. Electron. 105-C(1): 47-50 (2022)

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