"Evaluation of Side-Channel Leakage Simulation by Using EMC Macro-Model of ..."

Yusuke Yano et al. (2021)

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DOI: —

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type: Journal Article

metadata version: 2021-05-17

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  - journals/ieicetb/YanoITTKH21
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  - https://dblp.org/rec/journals/ieicetb/YanoITTKH21
Yusuke Yano, Kengo Iokibe, Toshiaki Teshima, Yoshitaka Toyota, Toshihiro Katashita, Yohei Hori:
Evaluation of Side-Channel Leakage Simulation by Using EMC Macro-Model of Cryptographic Devices. IEICE Trans. Commun. 104-B(2): 178-186 (2021)

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