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"Wafer-Level Characteristic Variation Modeling Considering Systematic ..."

Takuma Nagao et al. (2024)

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DOI: 10.1587/TRANSFUN.2023KEP0010

access: closed

type: Journal Article

metadata version: 2024-02-01

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Takuma Nagao, Tomoki Nakamura, Masuo Kajiyama, Makoto Eiki, Michiko Inoue, Michihiro Shintani:
Wafer-Level Characteristic Variation Modeling Considering Systematic Discontinuous Effects. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 107(1): 96-104 (2024)

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