"Critical Path Selection for Deep Sub-Micron Delay Test and Timing Validation."

Jing-Jia Liou et al. (2003)

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type: Journal Article

metadata version: 2021-06-08

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Jing-Jia Liou, Li-C. Wang, Angela Krstic, Kwang-Ting (Tim) Cheng:
Critical Path Selection for Deep Sub-Micron Delay Test and Timing Validation. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 86-A(12): 3038-3048 (2003)

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