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"Occurrence Prediction of Dislocation Regions in Photoluminescence Image of ..."

Hiroaki Kudo et al. (2021)

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DOI: 10.1587/TRANSFUN.2020IMP0010

access: closed

type: Journal Article

metadata version: 2022-10-02

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Hiroaki Kudo, Tetsuya Matsumoto, Kentaro Kutsukake, Noritaka Usami:
Occurrence Prediction of Dislocation Regions in Photoluminescence Image of Multicrystalline Silicon Wafers Using Transfer Learning of Convolutional Neural Network. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 104-A(6): 857-865 (2021)

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