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"On the High-Frequency Characteristics and Model of Bulk Effect in RF MOSFETs."

Ming-Ta Yang et al. (2005)

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DOI: 10.1093/IETELE/E88-C.5.838

access: closed

type: Journal Article

metadata version: 2020-04-11

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  - https://dblp.org/rec/journals/ieicet/YangWHYKK05
Ming-Ta Yang, Yo-Jen Wang, Patricia Pei-Chen Ho, Tzu-Jin Yeh, Darryl Chih-Wei Kuo, Chin-Wei Kuo:
On the High-Frequency Characteristics and Model of Bulk Effect in RF MOSFETs. IEICE Trans. Electron. 88-C(5): 838-844 (2005)

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