"Impact of Discrete-Charge-Induced Variability on Scaled MOS Devices."

Kiyoshi Takeuchi (2012)

Details and statistics

DOI: 10.1587/TRANSELE.E95.C.414

access: closed

type: Journal Article

metadata version: 2020-04-11

a service of  Schloss Dagstuhl - Leibniz Center for Informatics