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"Radiated Harmonics Characterization of CMOS Test Chip with On-Chip ..."

Toshio Sudo (2005)

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DOI: 10.1093/IETCOM/E88-B.8.3195

access: closed

type: Journal Article

metadata version: 2020-04-11

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Toshio Sudo:
Radiated Harmonics Characterization of CMOS Test Chip with On-Chip Decoupling Capacitance. IEICE Trans. Commun. 88-B(8): 3195-3199 (2005)

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