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"Selective Low-Care Coding: A Means for Test Data Compression in Circuits ..."

Youhua Shi et al. (2006)

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DOI: 10.1093/IETFEC/E89-A.4.996

access: closed

type: Journal Article

metadata version: 2020-10-26

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  - https://dblp.org/rec/journals/ieicet/ShiTKYO06
Youhua Shi, Nozomu Togawa, Shinji Kimura, Masao Yanagisawa, Tatsuo Ohtsuki:
Selective Low-Care Coding: A Means for Test Data Compression in Circuits with Multiple Scan Chains. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 89-A(4): 996-1004 (2006)

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