"Kink Suppression and High Reliability of Asymmetric Dual Channel Poly-Si ..."

Joong-Hyun Park, Myunghun Shin (2019)

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DOI: 10.1587/TRANSELE.E102.C.95

access: closed

type: Journal Article

metadata version: 2020-04-11

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Joong-Hyun Park, Myunghun Shin:
Kink Suppression and High Reliability of Asymmetric Dual Channel Poly-Si Thin Film Transistors for High Voltage Bias Stress. IEICE Trans. Electron. 102-C(1): 95-98 (2019)

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