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"Analysis of Test Generation Complexity for Stuck-At and Path Delay Faults ..."

Chia Yee Ooi, Thomas Clouqueur, Hideo Fujiwara (2007)

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DOI: 10.1093/IETISY/E90-D.8.1202

access: closed

type: Journal Article

metadata version: 2020-04-11

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Chia Yee Ooi, Thomas Clouqueur, Hideo Fujiwara:
Analysis of Test Generation Complexity for Stuck-At and Path Delay Faults Based on tau^k-Notation. IEICE Trans. Inf. Syst. 90-D(8): 1202-1212 (2007)

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